Hydrofluoric acid 48.50 - 49.50 %, CMOS, J.T.Baker®
Supplier: VWR
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Danger
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Management of Change (MOC) category = R
9585-69
BAKR9585-69
JT9585-69EA
3.73
USD
JT9585-69
CAJT9585-69
Hydrofluoric acid 48.50 - 49.50 %, CMOS, J.T.Baker®
Hydrofluoric acid
Formula:
HF MW: 20.01 g/mol Melting Pt: –36 °C Storage Temperature: Ambient |
MDL Number:
MFCD00011346 CAS Number: 7664-39-3 EINECS: 231-634-8 UN: 1790 ADR: 8,II |
Specification Test Results
For Microelectronic Use | |
Assay (HF) | 48.50 - 49.50 % |
Fluosilicic Acid (H₂SiF₆) | ≤50 ppm |
Chloride (Cl) | ≤5000 ppb |
Nitrate (NO₃) | ≤3000 ppb |
Phosphate (PO₄) | ≤1000 ppb |
Sulfate (SO₄) | ≤5000 ppb |
Trace Impurities - Arsenic (As) | ≤10.0 ppb |
Trace Impurities - Antimony (Sb) | ≤10.0 ppb |
Trace Impurities - Aluminum (Al) | ≤10.0 ppb |
Trace Impurities - Barium (Ba) | ≤10.0 ppb |
Trace Impurities - Boron (B) | ≤10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤10.0 ppb |
Trace Impurities - Calcium (Ca) | ≤10.0 ppb |
Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
Trace Impurities - Copper (Cu) | ≤10.0 ppb |
Trace Impurities - Iron (Fe) | ≤10.0 ppb |
Trace Impurities - Lead (Pb) | ≤10.0 ppb |
Trace Impurities - Lithium (Li) | ≤10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤10.0 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤10.0 ppb |
Trace Impurities - Potassium (K) | ≤10.0 ppb |
Trace Impurities - Sodium (Na) | ≤10.0 ppb |
Trace Impurities - Tin (Sn) | ≤10.0 ppb |
Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤10.0 ppb |
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